Presentation
Class Balanced Sampling for the Training in GANs
SessionPosters Gallery
Contributors
Event Type
Poster
TimeThursday, December 1610am - 6pm JST
LocationHall E (B2F, E Block)
DescriptionWe propose class standardized critic score based sample selection which enables class balanced sample selection. Our method achieves improved FID score and Intra-FID score compared to prior Top-k selection.
Contributors
